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F. Tochikubo, S. Uchida, H. Yasui and K. Sato, “Numerical Simulation of NO Oxidation in Dielectric Barrier Discharge with Microdischarge Formation,” Japanese Journal of Applied Physics, Vol. 48, No. 7, 2009, pp. 076507. doi:10.1143/JJAP.48.076507

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