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A. E. Yankovskaya and S. V. Kitler, “Parallel Algorithm for Constructing k-Valued Fault-Tolerant Diagnostic Tests in Intelligent Systems,” Pattern Recognition and Image Analysis, Vol. 22, No. 3, 2012, pp. 473-482. doi:10.1134/S105466181203008X

has been cited by the following article:

• TITLE: Intelligent System for Parallel Fault-Tolerant Diagnostic Tests Construction

  AUTHORS: Anna Yankovskaya, Sergei Kitler

  KEYWORDS: Intelligent System; Test Methods of Pattern Recognition; Matrix Model of Knowledge and Data Representation; Revealing of Various Kinds Regularities; Fault-Tolerant Diagnostic Tests; Parallel Algorithm; Irredundant H-Fold Column Coverings of Boolean Matrix

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.6 No.4A, April 29, 2013

  ABSTRACT: This investigation deals with the intelligent system for parallel fault-tolerant diagnostic tests construction. A modified parallel algorithm for fault-tolerant diagnostic tests construction is proposed. The algorithm is allowed to optimize processing time on tests construction. A matrix model of data and knowledge representation, as well as various kinds of regularities in data and knowledge are presented. Applied intelligent system for diagnostic of mental health of population which is developed with the use of intelligent system for parallel fault-tolerant DTs construction is suggested.