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K. Omote and J. Harada, “Grazing-Incidence X-Ray Diffractometer for Determining In-Plane Structure of Thin Films,” Advances in X-Ray Analysis, Vol. 43, 2000, pp. 192-200.

has been cited by the following article:

• TITLE: High Resolution X-Ray Diffraction Analyses of (La,Sr)MnO3/ZnO/Sapphire(0001) Double Heteroepitaxial Films

  AUTHORS: Katsuhiko Inaba, Shintaro Kobayashi, Kenichi Uehara, Akira Okada, Sanapa Lakshmi Reddy, Tamio Endo

  KEYWORDS: X-Ray Diffraction; Heteroepitaxy; LSMO; Orientational Relations

  JOURNAL NAME: Advances in Materials Physics and Chemistry, Vol.3 No.1A, April 26, 2013

  ABSTRACT: The epitaxial relationships of lattices and crystalline qualities of LSMO/ZnO/sapphire double-hetero systems were thoroughly analyzed using X-ray diffraction techniques with a modern high resolution XRD system. It was revealed that the epitaxial growth of the LSMO (110) phase was promoted under higher temperature accompanying the suppression of other competitive growth of the LSMO (001) and (111) phases. Supplying the plasma oxygen accelerated the suppression of the LSMO (111) phase. The complex epitaxial orientational relationships in these three growth modes were revealed from the precise analyses with the high resolution out-of-plane XRD and the in-plane XRD measurements, pole figure measurements, and reciprocal space mappings measurements, as [112ˉ](111)LSMO//[11ˉ00](0001)ZnO//[112ˉ0](0001)Sap, [110ˉ](111LSMO)//[11ˉ00](0001)Zno//[112ˉ0](0001)Sap, and [110](001)LSMO//[11ˉ00](0001)Zno//[112ˉ0](0001)Sap. The validity of this model for the epitaxial orientational relationships in LSMO/ZnO/sapphire double heteroepitaxial layers was confirmed identically with the data ana- lyses of the out-of-plane wide-range Reciprocal Space Mapping using the 2-dimensional X-ray detector.