Article citationsMore>>

B. B. He, K. L. Smith, U. Preckwinkel and W. Schultz, “Micro-Area Residual Stress Measurement Using a Two- Dimensional Detector,” Materials Science Forum, Vol. 347-349, 2000, pp. 101-106. doi:10.4028/www.scientific.net/MSF.347-349.101

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top