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C. H. Lee, Y. T. Kim and D. H. Park, “S-shaped Software Reliability Growth Models Derived from Stochastic Differential Equations,” IIE Transactions, Vol. 36, No. 12, 2004, pp. 1193-1199. doi:10.1080/07408170490507792

has been cited by the following article:

• TITLE: Lognormal Process Software Reliability Modeling with Testing-Effort

  AUTHORS: Shinji Inoue, Shigeru Yamada

  KEYWORDS: Software Reliability Growth Model; Lognormal Process; Testing-Effort Function; Software Reliability Assessment Measures; Goodness-of-Fit

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.6 No.4A, April 23, 2013

  ABSTRACT: We propose a software reliability growth model with testing-effort based on a continuous-state space stochastic process, such as a lognormal process, and conduct its goodness-of-fit evaluation. We also discuss a parameter estimation method of our model. Then, we derive several software reliability assessment measures by the probability distribution of its solution process, and compare our model with existing continuous-state space software reliability growth models in terms of the mean square error and the Akaike’s information criterion by using actual fault count data.