TITLE:
Lognormal Process Software Reliability Modeling with Testing-Effort
AUTHORS:
Shinji Inoue, Shigeru Yamada
KEYWORDS:
Software Reliability Growth Model; Lognormal Process; Testing-Effort Function; Software Reliability Assessment Measures; Goodness-of-Fit
JOURNAL NAME:
Journal of Software Engineering and Applications,
Vol.6 No.4A,
April
23,
2013
ABSTRACT: We propose a software reliability
growth model with testing-effort based on a continuous-state space stochastic
process, such as a lognormal process, and conduct its goodness-of-fit
evaluation. We also discuss a parameter estimation method of our model. Then,
we derive several software reliability assessment measures by the probability
distribution of its solution process, and compare our model with existing
continuous-state space software reliability growth models in terms of the mean
square error and the Akaike’s information criterion by using actual fault count
data.