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C. H. Kim, K. Roy, S. Hsu, R. Krishnamurthy and S. Borkar, “A Process Variation Compensating Technique with an On-Die Leakage Current Sensor for Nanometer Scale Dynamic Circuits,” IEEE Transactions on VLSI Systems, Vol. 14, No. 6, 2006, pp. 646-649. doi:10.1109/TVLSI.2006.878226

has been cited by the following article:

• TITLE: Timing-Driven Variation-Aware Partitioning and Optimization of Mixed Static-Dynamic CMOS Circuits

  AUTHORS: Kumar Yelamarthi

  KEYWORDS: Timing Optimization; Dynamic CMOS Circuits; Process Variations; Delay Uncertainty

  JOURNAL NAME: Circuits and Systems, Vol.4 No.2, April 17, 2013

  ABSTRACT: The advancement in CMOS technology has surpassed the progress in computer aided design tools, creating an avenue for new design optimization flows. This paper presents a design level transistor sizing based timing optimization algorithms for mixed-static-dynamic CMOS logic designs. This optimization algorithm performs timing optimization through partitioning a design into static and dynamic circuits based on timing critical paths, and is further extended through a process variation aware circuit level timing optimization algorithm for dynamic CMOS circuits. Implemented on a 64-b adder and ISCAS benchmark circuits for mixed-static-dynamic CMOS, the design level optimization algorithm demonstrated a critical path delay improvement of over 52% in comparison with static CMOS implementation by state-of-the-art commercial optimization tools.