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A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray and S. Vo, “A Statistical Test Suite for Random and Pseudo Random Number Generators for Cryptographic Applications,” National Institute of Standards and Technology Special Publication 800-22, 2001.

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