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L. Castro, H. Gómez and M. Valenzuela, “Epsilon Half-Normal Model: Properties and Inference,” Computational Statistics & Data Analysis, Vol. 56, No. 12, 2012, pp. 4338-4347. Hdoi:10.1016/j.csda.2012.03.020

has been cited by the following article:

• TITLE: An Epsilon Half Normal Slash Distribution and Its Applications to Nonnegative Measurements

  AUTHORS: Wenhao Gui, Pei-Hua Chen, Haiyan Wu

  KEYWORDS: Epsilon Half Normal Distribution; Slash Distribution; Kurtosis; Skewness; Maximum Likelihood Estimation

  JOURNAL NAME: Open Journal of Optimization, Vol.2 No.1, March 29, 2013

  ABSTRACT: We introduce a new class of the slash distribution using the epsilon half normal distribution. The newly defined model extends the slashed half normal distribution and has more kurtosis than the ordinary half normal distribution. We study the characterization and properties including moments and some measures based on moments of this distribution. A simulation is conducted to investigate asymptotically the bias properties of the estimators for the parameters. We illustrate its use on a real data set by using maximum likelihood estimation.