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W. Spielmeyer, R. P. Singh, H. McFadden, C. R. Wellings, J. Huerta-Espino, X. Kong, R. Appels and E. S. Lagudah, “Fine Scale Genetic and Physical Mapping Using Interstitial Deletion Mutants of Lr34/Yr18: A Disease Resistance Locus Effective against Multiple Pathogens in Wheat,” Theoretical and Applied Genetics, Vol. 116, No. 4, 2008, pp. 481-490. doi:10.1007/s00122-007-0684-0

has been cited by the following article:

• TITLE: Review Article: High-Temperature Adult-Plant Resistance, Key for Sustainable Control of Stripe Rust

  AUTHORS: Xianming Chen

  KEYWORDS: Tricicum aestivum; Hordeum vulgare; Puccinia striiformis; Durable Resistance; Non-Race Specific Resistance

  JOURNAL NAME: American Journal of Plant Sciences, Vol.4 No.3, March 28, 2013

  ABSTRACT: High-temperature adult-plant (HTAP) resistance expresses when plants grow old and the weather becomes warm. This non-race specific and durable type of resistance has been used successfully in control of wheat stripe rust in the US since early 1960s. This article describes practical procedures for identification and characterization of HTAP resistance and reviews recent studies on discovery of genes conferring HTAP resistance. Recent studies providing insights to the molecular basis for the durability of HTAP resistance will be presented. Strategies for improving levels of HTAP resistance and improving control of stripe rust through combining HTAP resistance with effective all-stage resistance will be discussed.