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Q. Li, X. M. Chen, M. N. Wang and J. X. Jing, “Yr45, a New Wheat Gene for Stripe Rust Resistance Mapped on the Long Arm of Chromosome 3D,” Theoretical and Applied Genetics, Vol. 122, No. 1, 2010, pp. 189-197. doi:10.1007/s00122-010-1435-1

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