Article citationsMore>>

Z. X. Shi, X. M. Chen, R. F. Line, H. Leung and C. R. Wellings, “Development of Resistance Gene Analog Poly-morphism Markers for the Yr9 Gene Resistance to Wheat Stripe Rust,” Genome, Vol. 44, No. 4, 2001, pp. 509-516.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top