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X. M. Chen and R. F. Line, “Gene Action in Wheat Cultivars for Durable High-Temperature Adult-Plant Resistance and Interactions with Race-Specific, Seedling Resistance to Stripe Rust Caused by Puccinia striiformis,” Phytopathology, Vol. 85, 1995, pp. 567-572. doi:10.1094/Phyto-85-567

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