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P. Merel, M. Tabbal, M. Chaker, M. Moisan and A. Ricard, “Influence of the Field Frequency on the Nitrogen Atom Yield in the Remote Plasma of an N2 High Frequency Discharge,” Plasma Sources Science and Technology, Vol. 7, No. 4, 1998, p. 550. doi:10.1088/0963-0252/7/4/012

has been cited by the following article:

• TITLE: Transmission of N-Atoms Produced by N2 Flowing Microwave Afterglows through Hollow Tubes

  AUTHORS: Andre Ricard, Jean-Philippe Sarrette

  KEYWORDS: Spectroscopy; N-Atoms Transmission; Hollow Tubes; γ-Destruction Probability

  JOURNAL NAME: Journal of Analytical Sciences, Methods and Instrumentation, Vol.3 No.1, March 26, 2013

  ABSTRACT: Transmission of N-atoms (T N ) through small diameters tubes (1.5 and 3 mm internal diameter (i.d) and 9, 50 and 80 cm length for silicone tubes, 1.5 mm i.d and 6.5 cm length for stainless steel tubes) has been measured in late N2 and Ar-N2 flowing afterglows of microwave plasmas in continuous and pulsed gas injection at a flow rate of 1 and 3 Standard liter by minute (Slm), a gas pressure from 2 to 4 Torr for N2 and 20 Torr for Ar-1%N2 and a plasma power from 150 to 300 Watt. From the experimental TN values, it is deduced the γ-destruction probability inside the tube walls as being y = (1-1.6)×10-3 for the silicon tubes and y = (1.6-2)×10-2 for the stainless steel tubes.