Article citationsMore>>

P. B. Shashikanth, P. B. V. Prasad and G. S. Rao, “Oblique Incidence Reflection Microscopy (OIRM) on Hydrocarbon Films,” Crystal Research Technology, Vol. 34, No. 10, 1999, pp. 1287-1292.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top