Article citationsMore>>

G. Imen, “Caractérisation Thermique et Optique des Matériaux Semi-Conducteurs par la Technique de Déflexion Photothermique,” Ph.D. Thesis, Faculté des Sciences de Tunis Université el Manar, 2011.

has been cited by the following article:

• TITLE: Study of Surface and Subsurface Defects in Materials by Photothermal Deflection Technique: Theory and Experience

  AUTHORS: A. Dhouib, A. Hamdi, N. Yacoubi

  KEYWORDS: Photothermal Deflection Technique; Surface Defect; Subsurface Defect; Thermal Wave

  JOURNAL NAME: Journal of Modern Physics, Vol.4 No.3, March 22, 2013

  ABSTRACT: Photothermal deflection is widely used to study defects in materials. Both high spatial resolution and high sensitivity are required to detect them. In order to improve the theoretical model in the case of uniform heating (one dimensional heat treatment) we have chosen to heat the sample by a halogen lamp. The sample which contains a known surface and subsurface defects is first covered by a thin graphite layer and placed in air. The sample fixed on a vertical holder is able to move in the x and y directions thanks a two stepper motors. The measurement showed excellent agreement between experimental and simulation results.