Article citationsMore>>

L. G. Chen, C. K. Ong and B. T. G. Tan, “Amendment of Cavity Perturbation Method for Permittivity Measurement of Extremely Low-Loss Dielectrics,” IEEE Transactons on Instrumentation and Measurement, Vol.48, No. 6, December 1999, pp. 1031-1037.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top