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J. H. Lee, S. H. Lee, W. S. Kim, H. J. Lee, J. N. Heo, T. W. Jeong, C. H. Choi, J. M. Kim, J. H. Park and J. S. Ha, “Uniformity Measurement Of Electron Emission From Carbon Nanotubes Using Electron-Beam Resist,” Journal of Vacuum Science & Technology B, Vol.23, No. 2, 2005, pp. 718-722.

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