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G. H. Chapman, V. K. Jain and S. Bhansali, “Defect Avoidance in 3-D Heterogeneous Sensor,” Proceedings of the 1992 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04), Cannes, 10-13 October 2005, pp. 67-75.

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