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V. J. Keast, A. J. Scott, R. Brydson, D. B. Williams and J. Bruley, “Electron Energy-Loss Near-Edge Structure—A Tool for the Investigation of Electronic Structure on the Nanometre Scale,” Journal of Microscopy, Vol. 203, No. 2, 2001, pp. 135-175.
doi:10.1046/j.1365-2818.2001.00898.x
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