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K. Roy, S. Mukhopadhyay and H. M. Meimand, “Leakage Current Mechanisms and Leakage Reduction Techniques in Deep-Submicrometer CMOS Circuits,” Proceedings of the IEEE, Vol. 91, No. 2, 2003, pp.305-327. doi:10.1109/JPROC.2002.808156

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