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J. Coraux, H. Renevier, V. Fa-vre-Nicolin, G. Renaud, and B. Daudin, “In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth”, J. Appl. Phys, Vol. 88, No. 15, 2007, pp.1-3. doi: 10.1063/1.2192572

has been cited by the following article:

• TITLE: Controllable Growth of Ni Nanocrystals Embedded in BaTiO3/SrTiO3 Superlattices

  AUTHORS: Zhengwei Xiong, Weidong Wu

  KEYWORDS: Nanocrystal; Superlattices; Self-organization

  JOURNAL NAME: Modeling and Numerical Simulation of Material Science, Vol.3 No.1B, January 21, 2013

  ABSTRACT: BaTiO3/SrTiO3 superlattices with embedded Ni nanocrystals (NCs) have been grown on SrTiO3 (001) substrate using laser molecular beam epitaxy (L-MBE). In situ reflection high-energy electron diffraction (RHEED) was employed to investigate the process of lattice strain in the self-organization of Ni NCs and the epitaxial growth of BaTiO3/SrTiO3 superlattices. The results indicated that the strain from large lattice mismatch drove the self-organization of Ni NCs. Also, the layer-by-layer growth of BaTiO3/SrTiO3 superlattices Keywords: Nanocrystal; Superlattices; Self-organization 1. Introduction Oxide artificial superlattices, especially (001) oriented BaTiOsuperlattices and the island growth of Ni NCs were controllable ac-curately. The fine alternation of the two processes would provide a possible route to engineer controllably the nano-composite microstructure.