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M. Bachmaier and H. Auernhammer, “Yield Mapping Based on Robust Fitting Paraboloid Cones in Butterfly and Elliptic Neighborhoods,” In: J. V. Stafford and A. Werner, Ed., Precision Agriculture '05: Proceedings of the 5th European Conference on Precision Agriculture, Wageningen Academic Publishers, Wageningen, the Netherlands, 2005, pp. 741-750.

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