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M. Hoener, et al., “Ultraintense X-Ray Induced Ionization, Dissociation, and Frustrated Absorption in Molecular Nitrogen,” Physical Review Letters, Vol. 104, No. 25, 2010, Article ID: 253002. doi:10.1103/PhysRevLett.104.253002

has been cited by the following article:

• TITLE: A Review Study on Amplification of X-Ray Free Electron Laser Pulse in Plasma

  AUTHORS: Ashutosh Sharma

  KEYWORDS: X-Ray Free Electron Laser; Raman Amplification; Laser-Plasma Interaction

  JOURNAL NAME: Journal of Modern Physics, Vol.3 No.12, December 31, 2012

  ABSTRACT: In view of X-ray Free Electron Laser (XFEL) intensity prospects, we reviewed the past and recent work in view of amplification of powerful XFEL laser pulse to achieve intensity in the regime of high field science. We report here some of the relevant work investigated in this field and predicted further scalings and possibilities for XFEL pulse amplification.