Article citationsMore>>

A. Rukhin, J. Soto, J. Nechvatal, M. Smid, E. Barker, S. Leigh, M. Levenson, M. Vangel, D. Banks, A. Heckert, J. Dray and S. Vo, “Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications,” Special Publication 800-22 Revision 1a, National Institute of Standards and Technology, 2010.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top