Article citationsMore>>

R. Swanepoel, “Determination of the Thickness and Optical Constants of Amorphous Silicon,” Journal of Physics E: Scientific Instruments, Vol. 16, No. 12, 1983, pp. 1214-1216.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top