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S. Couet, T. H. Diederich, K. Schlage and R. R?hlsberger, “A Compact UHV Deposition System for in situ Study of Ultrathin Films via Hard X-Ray Scattering and Spec- troscopy,” Review of Scientific Instruments, Vol. 79, No. 9, 2008, pp. 093908-1-093908-9.

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