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R. Huang, H. M. Wu, J. F. Kang, D. Y. Xiao, X. L. Shi, X. An, Y. Tian, R. S. Wang, L. L. Zhang, X. Zhang, et al., “Challenges of 22 nm and beyond CMOS Technology,” Science in China Series F: Information Sciences, Vol. 52, No. 9, 2009, pp. 1491-1533.

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