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P. Mitra, A. P. Chatterjee and H. S. Maiti, “ZnO Thin Film Sensor,” Materials Letters, Vol. 35, No. 1-2, 1998, pp. 33-38. doi:10.1016/S0167-577X(97)00215-2

has been cited by the following article:

• TITLE: Synthesis and Characterization of Cr Doped ZnO Nanocrystals

  AUTHORS: Vishwanath Dattu Mote, Vishnu Ramrao Huse, Babasaheb Nivrutti Dole

  KEYWORDS: Wurtzite Structure; Average Grain Size; Scherrer’s Formula; FTIR Spectra

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.2 No.4, November 26, 2012

  ABSTRACT: Samples of chromium doped ZnO were synthesized using co-precipitation technique at room temperature. Structural and optical properties of Cr doped ZnO samples were investigated by X-ray diffraction technique (XRD and UV-Visible spectroscopy (UV-Vis) respectively. X-ray diffraction (XRD) patterns confirm that the samples have hexagonal (wurtzite) structure with no additional peak which suggests that Cr ions go to the regular Zn sites in the ZnO crystal structure. The lattice constants were calculated using X-ray diffraction data and it is found that lattice parameters decrease with increasing Cr content. The average grain size was calculated using Scherrer’s formula for pure and Cr doped ZnO samples and it is observed that grain size is in the range 11 to17 nm. Band gap of Zn1–xCrxO samples has been evaluated using UV-Vis spectrometer. It is found that the band gap decreases as Cr increases; it is attributed to the s-d and p interactions and the smaller average grain size. It indicates that incorporation of Cr ions into the ZnO matrix. The chemical species of the grown crystals were identified by Fourier transform infrared spectroscopy (FTIR). From FTIR spectra it is observed that IR peaks corresponding to the Zn-O bands. Such results are presented in this paper quantitatively and qualitatively.