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J. G. W. Bentley, P. G. Bishop, and M. J. P. van der Meulen, “An empirical exploration of the difficulty function,” in Computer Safety, Reliability and Security (Safe-comp), 2004.

has been cited by the following article:

• TITLE: Design Pattern Representation for Safety-Critical Embedded Systems

  AUTHORS: Ashraf Armoush, Falk Salewski, Stefan Kowalewski

  KEYWORDS: Design Pattern, Embedded Systems, Non-Functional Requirements, Safety-Critical Systems

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.2 No.1, April 16, 2009

  ABSTRACT: Design Patterns, which give abstract solutions to commonly recurring design problems, have been widely used in the software and hardware domain. As non-functional requirements are an important aspect in the design of safety-critical embedded systems, this work focuses on the integration of non-functional implications in an existing design pattern concept. We propose a pattern representation for safety-critical embedded application design methods by including fields for the implications and side effects of the represented design pattern on the non-functional requirements of the overall systems. The considered requirements include safety, reliability, modifiability, cost, and execution time.