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Y. W. Leung, “Maximum likelihood voting for fault- tolerant software with finite output space,” IEEE Transac-tions on Reliability, Vol. 44, No. 3, 1995.

has been cited by the following article:

• TITLE: Design Pattern Representation for Safety-Critical Embedded Systems

  AUTHORS: Ashraf Armoush, Falk Salewski, Stefan Kowalewski

  KEYWORDS: Design Pattern, Embedded Systems, Non-Functional Requirements, Safety-Critical Systems

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.2 No.1, April 16, 2009

  ABSTRACT: Design Patterns, which give abstract solutions to commonly recurring design problems, have been widely used in the software and hardware domain. As non-functional requirements are an important aspect in the design of safety-critical embedded systems, this work focuses on the integration of non-functional implications in an existing design pattern concept. We propose a pattern representation for safety-critical embedded application design methods by including fields for the implications and side effects of the represented design pattern on the non-functional requirements of the overall systems. The considered requirements include safety, reliability, modifiability, cost, and execution time.