TITLE:
Challenges in Quality Certification of I/O Libraries
AUTHORS:
Oleg Semenov, Dmitry Vasiounin, Victor Spitsyn
KEYWORDS:
I/O Library; Electrostatic Discharge; Quality Certification; Latch-Up; I/O Driver
JOURNAL NAME:
Circuits and Systems,
Vol.3 No.4,
October
30,
2012
ABSTRACT: Cooperation between manufacturing and other functional groups is critical to improve the success of new products. However, integrating operations and development methodologies is often challenging due to conflicting priorities and organizational structures. Improving the quality of product development and the transition to manufacturing is not a new venture. Organizations have been incorporating planning and continuous improvement to their product develop-ment initiatives for decades. This paper summarizes the experience of I/O libraries quality certification within Freescale Semiconductor and describes the certification flow developed by Corporate Quality and I/O Design teams.