Article citationsMore>>

P. H. Woerlee, M. J. Knitel, R. V. Langevelde, D. B. Klaassen, L. F. Tiemeijer and A. J. Scholten, “RF CMOS Performance Trends,” IEEE Transaction on Electron De-vices, Vol. 48, No. 8, August 2001, pp. 1776-1782.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top