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N. Ruiz-Reyes, P. Vera-Candeas and J. Curpian-Aloma, “High Resolution Pursuit for Detecting Flaw Echoed Close to the Material Surface in Ultrasonic NDT,” NDT&E International, Vol. 9, No. 39, 2006, pp. 487-492 doi:10.1016/j.ndteint.2006.02.002

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