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J. M. Koomen, W. K. Russell, J. M. Hettick and D. H. Russell, “Improvement of Resolution, Mass Accuracy, and Reproducibility in Reflected Mode DE-MALDI-TOF Analysis of DNA Using Fast Evaporation-Overlayer Sample Preparations,” Analytical Chemistry, Vol. 72, No. 16, 2000, pp. 3860-3866. doi:10.1021/ac0001941

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