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A. Etin, G. E. Shter, S. Baltianski, G. S. Grader and G. M. Reisner, “Con-trolled elemental depth profile in sol-gel-derived PZT films”, Journal of the American Ceramic Society, Vol. 89, No. 8, 2006, 2387-2393. doi:10.1111/j.1551-2916.2006.01078.x

has been cited by the following article:

• TITLE: Phase Transformations in PZT Thin Films Prepared by Polymeric Chemical Method

  AUTHORS: Elton C. Lima, Eudes Borges Araújo

  KEYWORDS: PZT; Thin Films; Phase Transformation

  JOURNAL NAME: Advances in Materials Physics and Chemistry, Vol.2 No.3, September 28, 2012

  ABSTRACT: Lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/ Ti/SiO2/Si substrates to understand the mechanisms of phase transformations in these films. PZT films pyrolyzed at temperatures higher than 350℃ present a coexistence of pyrochlore and perovskite phases, while only perovskite phase is present in films pyrolyzed at temperatures lower than 300℃. For films where the pyrochlore and perovskite phase coexists the amount of pyrochlore phase decreases from top surface to the bottom film-electrode interface and the PZT structure near top surface are Ti-rich compositions while near the bottom film-electrode interface the compositions are Zr-rich. For pyrochlore-free PZT thin film, a small (100) orientation tendency near the film-electrode interface was observed.