Article citationsMore>>

Z. L. Wang, Z. R. Dai, R. P. Gao and J. L. Gole, “Measuring the Young's modulus of solid nanowires by in situ TEM,” J. Electron Microscopy, Vol. 51, 2002, S79-85. doi:10.1093/jmicro/51.Supplement.S79

has been cited by the following article:

• TITLE: Tunable Bending Stiffness, Buckling Force, and Natural Frequency of Nanowires and Nanoplates

  AUTHORS: Hanxing Zhu, Z. B. Wang, T. X. Fan, D. Zhang

  KEYWORDS: Nanowires; Nanoplates; Bending Stiffness; Buckling Force; Natural Frequency

  JOURNAL NAME: World Journal of Nano Science and Engineering, Vol.2 No.3, September 28, 2012

  ABSTRACT: This paper aims to obtain the simple closed-form results for the combined effects of surface elasticity, initial stress/ strain, and material Poisson ratio on the bending stiffness, natural frequency and buckling force of nanowires and nano-plates. The results demonstrate that all these properties of nanowires or nanoplates can be designed either very sensitive or not sensitive at all to the amplitude of an applied electric potential; show how much of those properties can be controlled to vary; and thus provide a reliable guide to the measurement of the Young’s modulus of nanowires/nanoplates and to the design of nano-devices, such as nano-sensors or the cantilever of an AFM.