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S. L. Lo, D. Buchanan, Y. Taur and W. Wang, “Quantum Mechanical Modeling of Electron Tunneling Current from the Inversion Layer of Ultra-Thin Oxide nMOSFETs,” IEEE on Electron Device Letters, Vol. 18, No. 5, 1997, pp. 209-211. doi:10.1109/55.568766

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