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W. J. McNutt, W. M. Johnson, R. A. Nelson and R. E. Ayers, “Power Transformen Short-Circuit Strength—Requirements, Design, and Demonstration,” IEEE Transactions on Power Apparatus and Systems, No. 8, 1970, pp. 1955-1969. Hdoi:10.1109/TPAS.1970.292780

has been cited by the following article:

• TITLE: New “Intellectual Networks” (Smart Grid) for Detecting Electrical Equipment Faults, Defects and Weaknesses

  AUTHORS: Alexander Yu. Khrennikov

  KEYWORDS: Intellectual Networks; Smart Grid; Monitoring System; Electrical Equipment; Information-Measuring System; Frequency Response Analysis; Transformer Winding Fault Diagnostic; Low Voltage Impulse Method; Short-Circuit Inductive Reactance Measurement

  JOURNAL NAME: Smart Grid and Renewable Energy, Vol.3 No.3, August 31, 2012

  ABSTRACT: The most important elements of “intellectual networks” (Smart Grid) are the systems of monitoring the parameters of electrical equipment. Information-measuring systems (IMS), which described in this paper, were proposed to use together with rapid digital protection against short-circuit regimes in transformer windings. This paper presents an application’s experience of LVI-testing, some results of the use of Frequency Response Analysis (FRA) to check the condition of transformer windings and infra-red control results of electrical equipment. The LVI method and short-circuit inductive reactance measurements are sensitive for detecting such faults as radial, axial winding deformations, a twisting of low-voltage or regulating winding, a losing of winding’s pressing and others.