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A. Yu. Khrennikov and O. A. Shlegel, “Extra High Voltage Transformer Short Circuit Steadiness Test Results and Their Effect on Calculations and Design,” Reports of 9th International Power System Conference, St. Petersburg, Vol. 2, 1994, pp. 1-121.

has been cited by the following article:

• TITLE: New “Intellectual Networks” (Smart Grid) for Detecting Electrical Equipment Faults, Defects and Weaknesses

  AUTHORS: Alexander Yu. Khrennikov

  KEYWORDS: Intellectual Networks; Smart Grid; Monitoring System; Electrical Equipment; Information-Measuring System; Frequency Response Analysis; Transformer Winding Fault Diagnostic; Low Voltage Impulse Method; Short-Circuit Inductive Reactance Measurement

  JOURNAL NAME: Smart Grid and Renewable Energy, Vol.3 No.3, August 31, 2012

  ABSTRACT: The most important elements of “intellectual networks” (Smart Grid) are the systems of monitoring the parameters of electrical equipment. Information-measuring systems (IMS), which described in this paper, were proposed to use together with rapid digital protection against short-circuit regimes in transformer windings. This paper presents an application’s experience of LVI-testing, some results of the use of Frequency Response Analysis (FRA) to check the condition of transformer windings and infra-red control results of electrical equipment. The LVI method and short-circuit inductive reactance measurements are sensitive for detecting such faults as radial, axial winding deformations, a twisting of low-voltage or regulating winding, a losing of winding’s pressing and others.