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C.-H. Chen, M. J. Deen, Y. Cheng and M. Matloubian, “Extraction of the Induced Gate Noise, Channel Noise, and Their Correlation in Submicron MOSFETs from RF Noise Measurements,” IEEE Transactions on Electron Devices, Vol. 48, No. 12, 2001, pp. 2884-2892. doi:10.1109/16.974722

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