Article citationsMore>>

H. Komatsu and S. Miyashita, “Comparison of Atomic Force Microscopy and Nanoscale Optical Microscopy for Measuring Step Heights,” Japanese Journal of Applied Physics, Vol. 32, 1993, pp. 1478-1479. doi:10.1143/JJAP.32.1478

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top