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M. V. Sopinskyy, P. E. Shepelyavyi, A. V. Stronski and E. F. Venger, “Ellipsometry and AFM Study of Post- Deposi-tion Transformations in Vacuum-Evaporated As-S-Se Films,” Journal of Optoelectronics and Advanced Mate-rials, Vol. 7, No. 5, 2005, pp. 2255- 2266.

has been cited by the following article:

• TITLE: Optical Absorption of Nano-Composite Thin Films of Au in Teflon

  AUTHORS: Dmytro Grynko, Konstantin Grytrsenko, Valeri Lozovski, Mykola Sopinskyy, Galyna Strilchuk

  KEYWORDS: Nano-Composite, Optical Absorption Spectra, Thin Film, Effective Susceptibility, Teflon, Gold, Vacuum Deposition

  JOURNAL NAME: Materials Sciences and Applications, Vol.1 No.3, August 25, 2010

  ABSTRACT: Nano-composite films of Au particles in Teflon were obtained by thermal vacuum deposition. The obtained films were characterized by the different shapes and dimensions of the inclusion particles. Absorption spectra of the films were measured in-situ. A model for the calculation of the optical properties of the nano-composite thin films with an inho-mogeneous distribution of the inclusions along the thickness of the film is proposed. Absorption properties of inclusions were analyzed by considering the local field interaction. The calculated absorption profiles are compared with the experimentally obtained absorption profiles. This comparison gives a possibility to draw conclusions about the concentration, shapes and shape distributions of the inclusion particles. For example, the films obtained by duration deposition are characterized by inclusions having the shape of prolate ellipsoids oriented normally to surface of the film.