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S. P. Singh, S. Kumar and A. Kumar, “Effect of Some Metallic Impurities on the Density of Localized States in a-Se80Te20 Thin Films,” Vacuum, Vol. 75, No. 4, 2004, pp. 313-320.

has been cited by the following article:

• TITLE: Estimation the Density of Localized State Glassy Se100–xZnx Thin Films by Using Space Charge Limited Conduction Measurement

  AUTHORS: Mohd. Nasir, M. Zulfequar

  KEYWORDS: Density of Localized State; dc Conductivity; Activation Energy (?E); SEM; Thin Films

  JOURNAL NAME: New Journal of Glass and Ceramics, Vol.2 No.2, April 23, 2012

  ABSTRACT: The dc conductivity in vacuum evaporated amorphous thin films of the glassy alloys Se100–xZnx(2 ≤ x ≤ 20) are meas-ured in the temperature range (308 - 388 K). The dc conductivity (σdc) is increases with increased of Zn concentration in the glassy alloys. The activation energy (ΔE) decreases with increase of Zn content. The conduction is explained on the basis of localized state in the mobility gap. To study the effect of electric field, a Current-Voltage characteristic has been measured at various fixed temperatures. The Current-Voltage data are fitted into the theory of space charge limited conduction in case of uniform distribution of traps in mobility gap at high electric fields (E ~104 V/cm) of these materials. The density of localized state (g0) are estimated by fitting in theory of space charge limited conduction (SCLC) at the temperature range of (352 - 372 K) in the glassy Se100–xZnx. The density of localized state (0) near the Fermi level are increases with increase of Zn concentration in the (Se100–xZnx) thin films and explain on the basis of increase of the Zn-Se bond.