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Taylor, M., Wall, J., Loxley, N., Wormington, M. and Lafford, T. (2001) High Resolution X-Ray Diffraction Using a High Brilliance Source, with Rapid Data Analysis by Auto-Fitting. Materials Science and Engineering: B, 80, 95-98.
https://doi.org/10.1016/s0921-5107(00)00621-8

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