TITLE:
Review of Modeling of Cracks in Silicon Photovoltaic Cells Using FEM and XFEM
AUTHORS:
Alain Ngenzi, Antoine Dieudonné Ndayisaba
KEYWORDS:
Silicon Photovoltaic Cell, FEM, XFEM, Crack Initiation, Crack Propagation
JOURNAL NAME:
Journal of Surface Engineered Materials and Advanced Technology,
Vol.16 No.3,
July
31,
2026
ABSTRACT: Cracks in crystalline silicon photovoltaic (PV) cells are a major reliability concern, because they reduce power output and shorten module service life. Numerical modeling has become an effective approach for understanding crack initiation and propagation under various manufacturing and operating conditions. This review presents recent advances in the application of the Finite Element Method (FEM) and the Extended Finite Element Method (XFEM) for modeling cracks in crystalline silicon photovoltaic cells. Following the PRISMA methodology, studies published between 2021 and 2026 were systematically reviewed to examine crack formation mechanisms, FEM and XFEM modeling approaches, material assumptions, loading conditions, and key findings. The review shows that FEM is widely employed to predict stress distribution, deformation, and thermo-mechanical behavior during manufacturing, transportation, installation, and service, while XFEM effectively simulates crack initiation and propagation without the need for remeshing. The reviewed studies further demonstrate that manufacturing-induced residual stresses, thermal cycling, mechanical loading, wafer thickness, and crack orientation significantly influence crack evolution and module reliability. However, several limitations remain, including simplified material assumptions, isolated treatment of loading conditions, limited consideration of electrical degradation, and insufficient experimental validation under realistic operating environments. The review highlights these challenges and identifies future research needs toward more comprehensive and experimentally validated numerical models capable of accurately predicting both crack evolution and the long-term reliability of crystalline silicon photovoltaic modules.