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I. Shay, N. Baer and R. Zeidman, “Measuring Whitespace Patterns as an Indication of Plagiarism,” Proceedings of the ADFSL Conference on Digital Forensics, Security and Law, St. Paul, 20 May 2010, pp. 63-72.

has been cited by the following article:

• TITLE: Measuring Whitespace Pattern Sequences as an Indication of Plagiarism

  AUTHORS: Nikolaus Baer, Robert Zeidman

  KEYWORDS: Plagiarism; Source Code; Source Code Similarity; Whitespace; Obfuscation; Indentation; Maintainability; Copyright Infringement; Intellectual Property; Litigation; Open Source

  JOURNAL NAME: Journal of Software Engineering and Applications, Vol.5 No.4, April 23, 2012

  ABSTRACT: There are several methods and technologies for comparing the statements, comments, strings, identifiers, and other visible elements of source code in order to efficiently identify similarity. In a prior paper we found that comparing the whitespace patterns was not precise enough to identify copying by itself. However, several possible methods for improving the precision of a whitespace pattern comparison were presented, the most promising of which was an examination of the sequences of lines with matching whitespace patterns. This paper demonstrates a method of evaluating the sequences of matching whitespace patterns and a detailed study of the method’s reliability.