Article citationsMore>>

JEDEC Solid State Technology Association (2010) Transient Dual Interface Test Method for the Measurement of the Thermal Resistance Junction-to-Case of Semi-Conductor Devices with Heat Flow through a Single Path (JESD51-14). JEDEC.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top