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Pham, T.K.H., Tran, B.Q., Nguyen, K.B., Pham, N.Y.N., Nguyen, T.H.Y., Nguyen, A.H., et al. (2025) Oxygen Partial Pressure Effects on Nickel Oxide Thin Films and NiO/Si Diode Performance. Materials Advances, 6, 1719-1725.
https://doi.org/10.1039/d4ma01113a

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