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Goldstein, J.I., Newbury, D.E., Michael, J.R., Ritchie, N.W.M., Scott, J.H.J. and Joy, D.C. (2018) Scanning Electron Microscopy and X-Ray Microanalysis. 4th Edition, Springer.
https://doi.org/10.1007/978-1-4939-6676-9

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